n-type Bi-Se-Te thin films have attracted a lot of interest as potential materials for future energy harvesting applications due to their exceptional thermoelectric characteristics. The paper presents the results of comprehensive research using Kelvin Probe Force Microscopy (KPFM) to investigate the electrical properties and energy-conversion potential of n-type Bi-Se-Te thin films. It is a powerful and versatile scanning probe microscopy technique that allows for the non-destructive and quantitative measurement of local surface potential variations at the nanoscale. The nanoscale local surface potential of a sample is the physical quantity evaluated in KPFM. The KPFM potential value of the applied electric field was increased, but it was observed that the average value dropped from 0.60 meV to 0.52 meV. Our studies with the KPFM explore the thin films' local surface potential variations and charge carrier concentration by measuring their local electrical potential and surface potential fluctuations. These findings contribute to ongoing efforts in the design and development of efficient and sustainable thermoelectric materials for future energy conversion applications. Additional experimental data and analyzes will be essential to further strengthen the study's findings.
"This work was supported by the Scientific and Technological Research Council of Turkey (TUBITAK) with project number 221M470. The current study was conducted by the Functional Materials Research Group (FMRG) Laboratory at Recep Tayyip Erdoğan University."
Anahtar Kelimeler: Atomic Force Microscopy (AFM), Kelvin Probe Force Microscopy (KPFM), n-type BiSeTe Thin Film, Surface Potential Fluctuations, 2D materials
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